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Proceedings Paper

Method for calibrating transmitted wavefront at any wavelength by refractive index formula
Author(s): Qiyuan Zhang; Sen Han; Haoyu Wang; Quanzhao Wang
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Paper Abstract

Testing wavefront distortions at the design wavelength is critical for optical system qualification. The wavefront aberrations is usually expressed in the Zernike polynomials form. As the available wavelength of the laser is limited, wavefronts of an optical system at only a few wavelengths can be test precisely. We consider the change in wavefront with wavelength is caused by the change in the refractive index of the optical material. In this paper we put forward a method for calibrating transmitted wavefront at any wavelength within certain limits. Transmitted wavefronts can be estimated at any wavelength utilizing the relationship between transmitted wavefront and wavelength. We study the relationship between transmitted wavefront Zernike coefficients and wavelength, and choose the Conrady formula to express the function of Zernike coefficients and wavelengths. Zernike coefficients at any wavelength in a certain range can be calculated by the Conrady formula at three other wavelengths. The transmitted wavefront at a specific wavelength can be fitted. Finally, we verify different kinds of optical systems by this method. The result shows the method is effective for the monochromatic system and the achromatic system, while the apochromatism system is form with special glass. The relationship between of the transmitted wavefront Zernike coefficients and wavelength is more complex.

Paper Details

Date Published: 6 November 2018
PDF: 13 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108191Z (6 November 2018); doi: 10.1117/12.2511225
Show Author Affiliations
Qiyuan Zhang, Changchun Univ. of Science and Technology (China)
Sen Han, Univ. of Shanghai for Science and Technology (China)
Suzhou H&L Instruments LLC (China)
Haoyu Wang, Univ. of Shanghai for Science and Technology (China)
Quanzhao Wang, Suzhou W&N Instruments LLC (China)


Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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