
Proceedings Paper
A fast infrared thermal imaging detection method based on spatial correlationFormat | Member Price | Non-Member Price |
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Paper Abstract
The existing infrared thermal imaging detection methods usually process the whole video stream data collected by a thermal camera, which involve large amounts of data and have a negative effect on the efficiency of defect detection. In this paper, we propose an infrared thermal imaging detection method which considers the spatial correlation of the adjacent images in the video stream data. By extracting the edge information and analyzing the correlation between two adjacent frames, the defect area and the non-defect area show different correlation coefficients, and only part of the video data is required for defect detection. Furthermore, the fusion method is introduced to enhance the image quality. The experiment results demonstrate that the proposed method can not only reflect the change of heat in the defect area during the heating process but also reduce computation time involved in the subsequent processing.
Paper Details
Date Published: 7 March 2019
PDF: 6 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110530C (7 March 2019); doi: 10.1117/12.2511101
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
PDF: 6 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110530C (7 March 2019); doi: 10.1117/12.2511101
Show Author Affiliations
Libing Bai, Univ. of Electronic Science and Technology of China (China)
Xue Chen, Univ. of Electronic Science and Technology of China (China)
Yuhua Cheng, Univ. of Electronic Science and Technology of China (China)
Xue Chen, Univ. of Electronic Science and Technology of China (China)
Yuhua Cheng, Univ. of Electronic Science and Technology of China (China)
Lulu Tian, Univ. of Electronic Science and Technology of China (China)
Bin Liu, Harbin Engineering Univ. (China)
Haichao Yu, Univ. of Electronic Science and Technology of China (China)
Bin Liu, Harbin Engineering Univ. (China)
Haichao Yu, Univ. of Electronic Science and Technology of China (China)
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
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