Share Email Print
cover

Proceedings Paper

Ghost reflection of testing long focal length lens with computer-generated hologram
Author(s): Jian-Peng Cui; Ning Zhang; Jie Liu; Hua Xu; Ding-Yao Yan; Ping Ma
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The ghost reflections can cause spurious fringes in the interferograms and lead to error in the measurement. So it is necessary to evaluate the influence of the ghost reflection spot for a correct interpretation of interferograms. In this paper, the ghost reflections of testing long focal length lens with computer-generated hologram (CGH) are investigated and geometrical model is established to obtain an expression for the size of the ghost reflection spot. Moreover, simulations and experiments are carried out by studying the ghost reflections of the long focal length lens in Shenguang III system.

Paper Details

Date Published: 30 January 2019
PDF: 6 pages
Proc. SPIE 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics, 108410Y (30 January 2019); doi: 10.1117/12.2510960
Show Author Affiliations
Jian-Peng Cui, Chengdu Fine Optical Engineering Research Ctr. (China)
Ning Zhang, Chengdu Fine Optical Engineering Research Ctr. (China)
Jie Liu, Chengdu Fine Optical Engineering Research Ctr. (China)
Hua Xu, Chengdu Fine Optical Engineering Research Ctr. (China)
Ding-Yao Yan, Chengdu Fine Optical Engineering Research Ctr. (China)
Ping Ma, Chengdu Fine Optical Engineering Research Ctr. (China)


Published in SPIE Proceedings Vol. 10841:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics
Mingbo Pu; Xiaoliang Ma; Xiong Li; Minghui Hong; Changtao Wang; Xiangang Luo, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray