We have examined experimentally the parameters of the photo- e.m.f. generated in the system containing the monocrystalline semiconductor and thin layer of nematic liquid crystal (NLC). Registered maxima quantity perfectly correlates with the ordering axis number. The present paper shows one of the ways of biaxial molecular ordering in NLC not registered before. It was shown also that the proposed method is both applicable as to the semiconductor surface superlattice symmetry type analysis and also to the ordered LC molecules concentration evaluation.

Date Published: 13 September 1996
PDF: 8 pages
Proc. SPIE 2877, Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III, (13 September 1996); doi: 10.1117/12.250941

Published in SPIE Proceedings Vol. 2877:
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III
Damon K. DeBusk; Ray T. Chen, Editor(s)