Proceedings Paper
Measuring the deformations of a scattering surface with a general purpose interferometer| Format | Member Price | Non-Member Price |
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Paper Abstract
The present work demonstrates the use of a general purpose interferometer to measure the deformations of a scattering surface by processing speckle patterns instead of smooth wavefronts. The operation of the interferometer are re- programmed to include algorithms adapted to handling speckle patterns. Details of the measuring operation are described, limits of applicability are discussed, and experimental results are presented.
Paper Details
Date Published: 18 September 1996
PDF: 4 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250810
Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)
PDF: 4 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250810
Show Author Affiliations
Marcelo Trivi, Istituto Nazionale di Ottica (Italy)
Vincenzo Greco, Istituto Nazionale di Ottica (Italy)
Vincenzo Greco, Istituto Nazionale di Ottica (Italy)
Lois M. Hoffer, Istituto Nazionale di Ottica (Italy)
Giuseppe Molesini, Istituto Nazionale di Ottica (Italy)
Giuseppe Molesini, Istituto Nazionale di Ottica (Italy)
Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)
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