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Proceedings Paper

Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects
Author(s): Daniel Van Labeke; A. Vial; Dominique Barchiesi
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Paper Abstract

The density of integration of magneto-optical devices is limited by diffraction of light. Recently some groups have proposed to use Near-Field Microscopy to overcome this limitation and some experiments have been performed both in transmission and reflection. In this paper we study theoretically magneto-optical effect in near-field. We consider a magneto-optical sample with details smaller than the wavelength. This sample is modelled as a multilayer rough structure. At least one layer has magneto-optical properties. The corrugation at the interfaces are very small compared to the optical wavelength. We do not consider the writing problem and the experiment is only modelled in the reading mode. Moreover, the magnetic properties are considered in the saturation regime. For this study we use an extension of the method that we used to describe near- field microscope with isotropic sample. The diffracted fields are determined in each layer by using a perturbative version of the Rayleigh method which leads to the resolution of a linear equation for each diffracted wave. The near- field above the sample is thus obtained by summing all the diffracted waves. We consider two geometries for the magnetization: polar effect where the magnetization is perpendicular to the sample and transversal effect where it is in the plane. We compare near-field images obtained in transmission and reflection by changing magnetization orientation. Comparisons with far-field results are also proposed.

Paper Details

Date Published: 18 September 1996
PDF: 11 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250786
Show Author Affiliations
Daniel Van Labeke, Univ. de Franche-Comte (France)
A. Vial, Univ. de Franche-Comte (France)
Dominique Barchiesi, Univ. de Franche-Comte (France)

Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

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