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Proceedings Paper

Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip
Author(s): J. Ferber; U. C. Fischer; J. Koglin; Harald Fuchs
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Paper Abstract

We present first results with a reflection mode SNOM, which uses a tetrahedral tip as an apertureless near-field probe. The SNOM was driven together with an STM to control the tip- surface distance in order to avoid mechanical damage of the tip.

Paper Details

Date Published: 18 September 1996
PDF: 11 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250781
Show Author Affiliations
J. Ferber, Westfaelische Wilhelms Univ. (Germany)
U. C. Fischer, Westfaelische Wilhelms Univ. (Germany)
J. Koglin, Westfaelische Wilhelms Univ. (Germany)
Harald Fuchs, Westfaelische Wilhelms Univ. (Germany)

Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

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