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Proceedings Paper

High-speed two-dimensional fringe analysis using frequency demodultion
Author(s): Yasuhiko Arai; Shunsuke Yokozeki; Kazuhiro Shiraki; Tomoharu Yamada
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Paper Abstract

This paper describes a new high speed 2D fringe analysis technique in the time domain using an electric circuit based on frequency demodulation. A 1D fringe analysis system based on this new technique has already been built, and its performance and characteristics were reported. With that system, a 1D fringe pattern could be processed every 10 msec. The accuracy was better than 1/20 fringe. In this paper, the principle of 1D fringe analysis is expanded to two dimensions. New electric circuits with which to process horizontal (x-) and vertical (z-) directional simultaneously were built. The paper proposes principles for the design of such circuits, which combine two outputs--one for the x- direction and the other for the z-direction. A new 2D fringe analysis system was then built using both analogue and digital processing circuits. Each fringe pattern was treated as an analogue signal synchronized with the CCD clock-pulse in the system. Using this new fringe analysis method, high- speed 2D image-processing can be realized. The system can process fourteen images a second. The characteristics of a laboratory prototype of this fringe analysis system were tested.

Paper Details

Date Published: 18 September 1996
PDF: 8 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250766
Show Author Affiliations
Yasuhiko Arai, Kansai Univ. (Japan)
Shunsuke Yokozeki, Kyushu Institute of Technology (Japan)
Kazuhiro Shiraki, Kansai Univ. (Japan)
Tomoharu Yamada, Kansai Univ. (Japan)

Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

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