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Proceedings Paper

Interferometric deformation measurement using object-induced dynamic phase-shifting
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Paper Abstract

A new method is presented that allows continuous deformation measurements to be performed. It is based on the use of the deformation-induced phase change produced at each pixel to compute an instantaneous phase with a dedicated phase- shifting algorithm. Examples in holographic, speckle and decorrelated speckle interferometry illustrate the interest of the method which provides both relative displacement phase maps and absolute temporal phase evolution curves.

Paper Details

Date Published: 18 September 1996
PDF: 4 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250742
Show Author Affiliations
Xavier Colonna de Lega, Swiss Federal Institute of Technology (Switzerland)
Pierre M. Jacquot, Swiss Federal Institute of Technology (Switzerland)

Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

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