Share Email Print

Proceedings Paper

Development and laboratory tests of deformation fiber optic sensors for civil engineering applications
Author(s): Laurent Vulliet; Nicoletta Casanova; Daniele Inaudi; Annette Osa-Wyser; Samuel Vurpillot
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A new displacement monitoring system based on low coherence interferometry using standard telecommunication fibers is presented. The measuring system is especially designed for the needs and conditions encountered in the field of civil engineering. The system features a precision of 10 micrometers to 100 micrometers (depending on the sensor type) over a measuring length up to 100 m, an operational range of 70 mm, stability over long periods (at least two years) and insensitivity to aging of the fiber and connector losses. The results of laboratory and field tests show that fiber optic extensometers are promising tools for the long term monitoring and survey of civil engineering structures. The theory and the optical set-up are briefly described as well as different sensor types that have been developed for various applications (bridges, tunnels, retaining walls, piles, anchorage cables) and tested in the field and in the laboratory. To validate the technique and calibrate the sensors laboratory testing has been done for short sensors (0.5 - 2 m) at IMM and for long sensors (2 - 10 m) at LMS. The results of these tests are presented and discussed in detail. IMM made several tests with fibers embedded in concrete beams and slabs measuring deformations due to shrinkage, creeping, and imposing traction, pressure and bending to the structure. Field tests on a rehabilitated bridge are also presented. Using a 10 m long calibration bench, LMS tested several fiber set-ups using different fixation techniques and imposed displacements on groups of extensometers with different lengths.

Paper Details

Date Published: 18 September 1996
PDF: 12 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250734
Show Author Affiliations
Laurent Vulliet, Swiss Federal Institute of Technology (Switzerland)
Nicoletta Casanova, IMM Instituto di Meccanica dei Materiali (Switzerland)
Daniele Inaudi, Swiss Federal Institute of Technology (Switzerland)
Annette Osa-Wyser, Swiss Federal Institute of Technology (Switzerland)
Samuel Vurpillot, Swiss Federal Institute of Technology (Switzerland)

Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?