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Proceedings Paper

Surface field measurement of photoconductive power switches using the electro-optic Kerr effect
Author(s): Harshad P. Sardesai; William C. Nunnally; Paul Frazer Williams
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Paper Abstract

We report our investigations of the surface electric fields present between the contacts of an optically controlled semiconductor switch. The experimental arrangement uses the Kerr electrooptic effect to measure the surface fields when a pulsed voltage is applied across a gap between two electrodes on planar samples fabricated on a silicon wafer. The system arrangement measurement technique and preliminary experimental data is presented for deposited aluminium contacts.

Paper Details

Date Published: 1 March 1991
PDF: 12 pages
Proc. SPIE 1378, Optically Activated Switching, (1 March 1991); doi: 10.1117/12.25058
Show Author Affiliations
Harshad P. Sardesai, Univ. of Texas/Arlington (United States)
William C. Nunnally, Univ. of Texas/Arlington (United States)
Paul Frazer Williams, Univ. of Nebraska/Lincoln (United States)

Published in SPIE Proceedings Vol. 1378:
Optically Activated Switching
Fred J. Zutavern, Editor(s)

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