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Proceedings Paper

Effects of wavelength on polarization correlated imaging of rough surface objects
Author(s): Xiang Zhai; Fan Xiang; Zhengdong Cheng; Yi Chen; Zhenyu Liang
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Paper Abstract

Correlated imaging is a research hotspot in recent years. It shows advantages over conventional optical imaging on scanning and imaging rate, noise immunity and so on, and has good application prospects in military electronic reconnaissance and other fields According to the basic principle of polarization correlation imaging, this paper established the spectral polarization BRDF model of rough surface. Taking two typical materials of aluminum alloy and PC plastic as target and background, the effects of wavelength on polarization correlated imaging of rough surface objects is analyzed. Theoretical analysis and simulation results show that the wavelength has little influence on the conventional correlated imaging, and the effects on the polarization correlated imaging appear in complex refractive index, linear polarization and contrast. The wavelength of the best imaging quality can be determined according to different material properties of the set target and the known background.

Paper Details

Date Published: 8 February 2019
PDF: 9 pages
Proc. SPIE 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging, 108430D (8 February 2019); doi: 10.1117/12.2505119
Show Author Affiliations
Xiang Zhai, National Univ. of Defense Technology (China)
Fan Xiang, National Univ. of Defense Technology (China)
Zhengdong Cheng, National Univ. of Defense Technology (China)
Yi Chen, National Univ. of Defense Technology (China)
Zhenyu Liang, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 10843:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging
Yadong Jiang; Xiaoliang Ma; Xiong Li; Mingbo Pu; Xue Feng; Bernard Kippelen, Editor(s)

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