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Proceedings Paper

A spectral calibration approach for snapshot Image Mapping Spectrometer (IMS)
Author(s): Zhenyi Ai; Yan Yuan; Lijuan Su; Xiaoming Ding; Wanyue Wang
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Paper Abstract

The snapshot image mapping spectrometer (IMS) is a hyper-spectral imaging system that simultaneously captures spatial and spectral information about an object in a single integral time. The spectral calibration can help to obtain accurate 3D datacube of the objects. This paper proposes a new approach to improve the spectral calibration accuracy of the instrument. By adding a slit mask into the optical path to reduce crosstalk, the accuracy of each sub pupil center and spectral channel location can be improved. The calibration process is simulated to analyze the effects of the size and position designed for the mask. The analysis results show that the calibration accuracy of each sub pupil center position and spectral channel position for IMS is 3μm, which is significantly improved than the calibration accuracy 10.5μm without the mask.

Paper Details

Date Published: 18 January 2019
PDF: 6 pages
Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390M (18 January 2019); doi: 10.1117/12.2504944
Show Author Affiliations
Zhenyi Ai, Beihang Univ. (China)
Yan Yuan, Beihang Univ. (China)
Lijuan Su, Beihang Univ. (China)
Xiaoming Ding, Beihang Univ. (China)
Wanyue Wang, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 10839:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Fan Wu; Yudong Zhang; Xiaoliang Ma; Xiong Li; Bin Fan, Editor(s)

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