Proceedings Paper
Development of high accuracy in-situ measurement system for spectral reflectance of thermal control coatings| Format | Member Price | Non-Member Price |
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Paper Abstract
In order to meet the experimental requirement of in-situ measurement for spectral reflectance of advanced thermal control coatings, a high accuracy in-situ measurement system for spectral reflectance of thermal control coatings of spacecraft is developed based on dual-beam spectrophotometry. The measurement wavelength range is 200 to 2500 nm, and the measurement accuracy is better than 0.5%. In the space ultraviolet radiation environmental effect test, it can realize the integrated test process of sample delivery, sampling, separation, in-situ measurement of spectral reflectance in vacuum.
Paper Details
Date Published: 8 November 2018
PDF: 10 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190P (8 November 2018); doi: 10.1117/12.2503691
Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)
PDF: 10 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190P (8 November 2018); doi: 10.1117/12.2503691
Show Author Affiliations
Pengsong Zhang, Beijing Institute of Spacecraft Environment Engineering (China)
Bolun Zhang, Beijing Institute of Spacecraft Environment Engineering (China)
Danyi Wang, Beijing Institute of Spacecraft Environment Engineering (China)
Shanping Jiang, Beijing Institute of Spacecraft Environment Engineering (China)
Bolun Zhang, Beijing Institute of Spacecraft Environment Engineering (China)
Danyi Wang, Beijing Institute of Spacecraft Environment Engineering (China)
Shanping Jiang, Beijing Institute of Spacecraft Environment Engineering (China)
Wei Leng, Beijing Institute of Spacecraft Environment Engineering (China)
Hongsong Li, Beijing Institute of Spacecraft Environment Engineering (China)
Linhua Yang, Beijing Institute of Spacecraft Environment Engineering (China)
Hongsong Li, Beijing Institute of Spacecraft Environment Engineering (China)
Linhua Yang, Beijing Institute of Spacecraft Environment Engineering (China)
Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)
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