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Proceedings Paper

AM0 performance measurement of triple-junction GaInP/InGaAs/Ge solar cells by a compound light source
Author(s): Haifeng Meng; Limin Xiong; Junchao Zhang; Yingwei He; Bifeng Zhang; Chuan Cai
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Paper Abstract

Because of their high efficiency and power weight ratio, triple-junction GaInP/InGaAs/Ge solar cells have become the main energy source for space on-orbit applications. Calibration of space solar cells under AM0 conditions is extremely important for satellite power system design, and accurate prediction of them is critical to solar array sizing. However, it’s not easy to conduct accurate measurement for multi-junction solar cells, especially in laboratory on earth. In this paper, by employing a highly AM0 spectrum-matched light source, which combined a Xenon lamp and a Halogen lamp with special filters, a method to measure the AM0 performance for triple-junction GaInP/InGaAs/Ge solar cells will be presented. The calibrated values of reference solar cells, including two component solar cells, were come from a national standard facility based on DSR (Differential Spectral Responsivity) method. After calibrating the compound light source by using the reference solar cells, key parameters of AM0 performance of triple-junction GaInP/InGaAs/Ge solar cells would be measured out, such as short-circuit current, open-circuit voltage and maximum power, etc. Spectral mismatch and other main influencing factors are also considered. It will provide a reliable route for multi-junction space solar cells’ photoelectric property measurement in laboratories on earth.

Paper Details

Date Published: 8 November 2018
PDF: 5 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190L (8 November 2018); doi: 10.1117/12.2502513
Show Author Affiliations
Haifeng Meng, National Institute of Metrology (China)
Limin Xiong, National Institute of Metrology (China)
Junchao Zhang, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Bifeng Zhang, National Institute of Metrology (China)
Chuan Cai, National Institute of Metrology (China)

Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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