
Proceedings Paper
The attitude measurement system of high-speed railway foundation settlement monitoring target surfaceFormat | Member Price | Non-Member Price |
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Paper Abstract
Aiming at the problem that the target deviation of settlement monitoring system affected the accuracy of settlement monitoring, a monitoring target attitude measurement system was designed to realize the real-time non-contact measurement of target pose. Firstly, the monocular vision and the monitoring target surface were combined, and the perspective projection model of the camera was established according to the known geometric constraint relationship between the two-dimensional feature points of the target surface. Then, for the five feature points arranged in a cross, based on the PnP problem, the HOMO algorithm was used to linearly solve the target pose. Based on this, the pose optimization solution was obtained by the nonlinear L-M algorithm. The system could perform real-time feature point image processing and pose calculation. An experimental platform for simulating the target pose measurement system in the surface settlement monitoring of ballastless track was built. The experimental results showed that the root mean square error of the three angles of the pose measurement system is 0.126°, 0.14°, 0.12°, and the whole identification process takes 1.9s. The measuring system had high calculation accuracy and was used in a short time, which was suitable for the flawless track surface settlement monitoring system.
Paper Details
Date Published: 6 November 2018
PDF: 7 pages
Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 108121B (6 November 2018); doi: 10.1117/12.2502486
Published in SPIE Proceedings Vol. 10812:
Semiconductor Lasers and Applications VIII
Ning Hua Zhu; Werner H. Hofmann, Editor(s)
PDF: 7 pages
Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 108121B (6 November 2018); doi: 10.1117/12.2502486
Show Author Affiliations
Jia Tao, Lanzhou Jiaotong Univ. (China)
Published in SPIE Proceedings Vol. 10812:
Semiconductor Lasers and Applications VIII
Ning Hua Zhu; Werner H. Hofmann, Editor(s)
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