
Proceedings Paper
Improved iris localization method for iris recognitionFormat | Member Price | Non-Member Price |
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Paper Abstract
Iris recognition technology has advantages of high security and high stability and can realize non-contact and living recognition. For iris recognition, iris localization is the first step. The localization precision is assurance of high recognition rate. The existing iris localization method has shortage of slow speed. In this paper, an improved iris region localization method is proposed. Firstly, the images are preprocessed with Gaussian blur algorithm. Then the center of the pupil is coarsely located by Gaussian template convolution operation. Finally, the center and the outer edge of the iris are precisely located based on the Integral-differential operation. In experiments, CASIA iris database is used to test the improved iris region localization method. The results show that the location time can be less than 200 ms and the location precision can reach 98. 82%. This method’s usefulness is verified and can promote the application of the iris recognition
Paper Details
Date Published: 24 July 2018
PDF: 5 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108271M (24 July 2018); doi: 10.1117/12.2501225
Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)
PDF: 5 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108271M (24 July 2018); doi: 10.1117/12.2501225
Show Author Affiliations
Sida Liang, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Aijun Zeng, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Liyuan Gu, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Univ. of Chinese Academy of Sciences (China)
Aijun Zeng, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Liyuan Gu, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Jingpei Hu, Shanghai Institute of Optics and Fine Mechanics (China)
Huijie Huang, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Huijie Huang, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)
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