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Proceedings Paper

Systematic parameter calibration in the wavefront testing with reverse Hartmann test
Author(s): Yamei Yin; Daodang Wang; Zhongmin Xie; Ming Kong; Jun Zhao; Lihua Lei; Yanhua Zeng; Wentao Zhang
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Paper Abstract

The deflectometry based on reverse-Hartmann-test configuration provides a feasible way for wavefront testing. Objects with complex surfaces place a high requirement on the wavefront testing accuracy, in which the systematic parameter is the key issue. In this paper, the effect of systematic parameters of the testing system such as the geometrical error and the approximation of systematic geometrical parameters are discussed in detail and a calibration method is proposed. Numerical simulation is carried out to demonstrate the feasibility of the proposed calibration method, for the transmitted wavefront with RMS 3.1220 μm, the testing optimization result of residual error with RMS value better than 20 nm is achieved.

Paper Details

Date Published: 5 November 2018
PDF: 9 pages
Proc. SPIE 10815, Optical Design and Testing VIII, 108150Q (5 November 2018); doi: 10.1117/12.2501143
Show Author Affiliations
Yamei Yin, China Jiliang Univ. (China)
Daodang Wang, China Jiliang Univ. (China)
Zhongmin Xie, China Jiliang Univ. (China)
Ming Kong, China Jiliang Univ. (China)
Jun Zhao, China Jiliang Univ. (China)
Lihua Lei, Shanghai Institute of Measurement and Testing Technology (China)
Yanhua Zeng, Shanghai Institute of Measurement and Testing Technology (China)
Wentao Zhang, Guilin Univ. of Electronic Technology (China)

Published in SPIE Proceedings Vol. 10815:
Optical Design and Testing VIII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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