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Proceedings Paper

Accurate time-delay measurement of optical delay components based on frequency-shifted self-heterodyne spectrum
Author(s): Mengke Wang; Yixiang Hu; Shangjian Zhang; Heng Wang; Xinhai Zou; Yali Zhang; Yong Liu
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Paper Abstract

An electrical method is proposed for the absolute time-delay characterization of optical delay components based on the frequency-shifted self-heterodyning. The method utilizes the electrical spectrum of the heterodyne products between the delayed optical signal and the frequency-shifted optical carrier, and achieves the intrinsic absolute time-delay measurement from the notch frequencies of the spectrum at microwave region. Moreover, our method enables highresolution and wide range measurement with low-frequency electrical spectrum analysis. The theoretical analysis is supported by experimental results.

Paper Details

Date Published: 6 November 2018
PDF: 6 pages
Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 108120E (6 November 2018); doi: 10.1117/12.2500656
Show Author Affiliations
Mengke Wang, Univ. of Electronic Science and Technology of China (China)
Yixiang Hu, Univ. of Electronic Science and Technology of China (China)
Shangjian Zhang, Univ. of Electronic Science and Technology of China (China)
Heng Wang, Univ. of Electronic Science and Technology of China (China)
Xinhai Zou, Univ. of Electronic Science and Technology of China (China)
Yali Zhang, Univ. of Electronic Science and Technology of China (China)
Yong Liu, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 10812:
Semiconductor Lasers and Applications VIII
Ning Hua Zhu; Werner H. Hofmann, Editor(s)

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