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Proceedings Paper

Progress towards picometer accuracy laser metrology for the space interferometry mission: update
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Paper Abstract

The Space Interferometry Mission, scheduled for launch in 2008, is an optical stellar interferometer with a 10 meter baseline capable of micro-arcsecond accuracy astrometry. A mission-enabling technology development program conducted at JPL, has yielded the heterodyne interferometric displacement metrology gauges required for monitoring the geometry of optical components of the stellar interferometer, and for maintaining stable starlight fringes. The gauges have <20 picometer linearity, <10 micron absolute accuracy, are stable to <200 pm over the typical SIM observation periods (~1 hour), have the ability to track the motion of mirrors over several meters. We discuss the technology that led to this level of performance: lowcross- talk, low thermal coefficient optics and electronics, active optical alignment, a dual wavelength laser source, and a continuously averaging, high data rate phase measurement technique. These technologies have wide applicability and are already being used outside of the SIM project, such as by the James Webb Space telescope (JWST) and Terrestrial Planet Finder (TPF) missions.

Paper Details

Date Published: 13 April 2018
PDF: 9 pages
Proc. SPIE 10568, International Conference on Space Optics — ICSO 2004, 105682L (13 April 2018); doi: 10.1117/12.2500128
Show Author Affiliations
Peter G. Halverson, Jet Propulsion Lab. (United States)
Oscar Alvarez-Salazar, Jet Propulsion Lab. (United States)
Alireza Azizi, Jet Propulsion Lab. (United States)
Frank Dekens, Jet Propulsion Lab. (United States)
Bijan Nemati, Jet Propulsion Lab. (United States)
Feng Zhao, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 10568:
International Conference on Space Optics — ICSO 2004
Josiane Costeraste; Errico Armandillo, Editor(s)

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