Share Email Print
cover

Proceedings Paper

MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with subnanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beam-launching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances and used for space-based applications.

Paper Details

Date Published: 13 April 2018
PDF: 9 pages
Proc. SPIE 10568, International Conference on Space Optics — ICSO 2004, 105682O (13 April 2018); doi: 10.1117/12.2500125
Show Author Affiliations
Robert D. Peters, Jet Propulsion Lab. (United States)
Oliver P. Lay, Jet Propulsion Lab. (United States)
Serge Dubovitsky, Jet Propulsion Lab. (United States)
Johan P. Burger, Jet Propulsion Lab. (United States)
Muthu Jeganathan, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 10568:
International Conference on Space Optics — ICSO 2004
Josiane Costeraste; Errico Armandillo, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray