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Proceedings Paper

Structured light measurement by double-scan technique
Author(s): Hansjoerg Gaertner; Peter Lehle; Hans J. Tiziani; C. Voland
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Paper Abstract

3D-measurement systems, that are based on triangulation, like light sectioning, structured light or stereo vision have a common problem. Certain areas of the object surface are not illuminated and others cannot be seen. In these regions no range data can be acquired and the resulting range map is incomplete. A new measurement setup with structured light is presented reducing this shadow/occlusion problem for many surfaces. For structured light measurement systems several patterns are projected onto the object to be measured. A CCD-camera acquired the images of the object illuminated with structured light patterns. For each pixel of the CCD-matrix there is a sequence of gray-values that corresponds to a light plane of the projector. The position of the pixel in the CCD-matrix determines a viewing beam. The intersection point of the viewing beam and the plane of light yields the three coordinates of a surface point of the object. In the new setup a pattern projector is used together with a camera. With a beam splitter, two color filters and mirrors two beams of different color and different angle of incidence are obtained. Thus, two colored patterns superimpose on the object. A color CCD-camera acquires the image for the range data measurement. Two of the three color channels detect the projection pattern of the corresponding color. A range data image is calculated from the two measurements. A nearly complete range data image result with no or only a few regions without range information.

Paper Details

Date Published: 21 August 1996
PDF: 10 pages
Proc. SPIE 2784, Vision Systems: Sensors, Sensor Systems, and Components, (21 August 1996); doi: 10.1117/12.248527
Show Author Affiliations
Hansjoerg Gaertner, Univ. Stuttgart (Germany)
Peter Lehle, Univ. Stuttgart (Germany)
Hans J. Tiziani, Univ. Stuttgart (Germany)
C. Voland, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 2784:
Vision Systems: Sensors, Sensor Systems, and Components
Otmar Loffeld, Editor(s)

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