
Proceedings Paper
Excess noise in fiber gyroscope sourcesFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The issue of excess14 noise is of interest with respect to the
broadband optical sources commonly used in interferometric fiber optic
gyroscopes because it can limit the ultimate sensitivity of the device.
Excess noise has been studied in superluminescent diodes (SLD's) by Yurek,
et .al. 1 and in an Erbium doped fiber by Morkel, et.al.2 . The latter group
also presented a simple model for the excess noise and demonstrated a
quantitative fit with the linewidth of their source.
In this letter we report measurements of excess noise in three
potential fiber gyroscope sources, SLD's at 0.83 pm and 1.3 .tm and a
superfluorescent Nd doped fiber at 1 .06 pm. These noise measure-ments
are shown to be in good agreement with the model of Ref. 2. The model
for excess noise is used to calculate the random walk coefficient due to
shot and excess noise in a interferometric fiber gyro to demonstrate the
impact excess noise in these sources will have on such a gyroscope. We
show that the gyros utilizing SLD sources are just barely impacted by
excess noise due to their limited output power (1-3 mW in a single mode
fiber). The fiber source at 1 .06 tim, with its higher potential output power,
will likely be limited by excess noise.
Paper Details
Date Published: 1 February 1991
PDF: 6 pages
Proc. SPIE 1367, Fiber Optic and Laser Sensors VIII, (1 February 1991); doi: 10.1117/12.24732
Published in SPIE Proceedings Vol. 1367:
Fiber Optic and Laser Sensors VIII
Ramon P. DePaula; Eric Udd, Editor(s)
PDF: 6 pages
Proc. SPIE 1367, Fiber Optic and Laser Sensors VIII, (1 February 1991); doi: 10.1117/12.24732
Show Author Affiliations
William K. Burns, Naval Research Lab. (United States)
Robert P. Moeller, Naval Research Lab. (United States)
Robert P. Moeller, Naval Research Lab. (United States)
Anthony D. Dandridge, Naval Research Lab. (United States)
Published in SPIE Proceedings Vol. 1367:
Fiber Optic and Laser Sensors VIII
Ramon P. DePaula; Eric Udd, Editor(s)
© SPIE. Terms of Use
