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Proceedings Paper

Reliability assurance of optoelectronic devices in the local loop
Author(s): Roy S. Koelbl
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Paper Abstract

Rapid development of Fiber-In-The-Loop (FITL) systems and FITL technology is bringing new challenges for assuring the reliability of optoelectronic devices. This can be attributed to several factors, some of which include: architecture, cost, useful lifetime of the optical source, and environmental conditions. Presently, relatively little is known about optoelectronic device reliability in the local loop. Thorough studies on the impact of loop applications and environments on the reliability of optoelectronic devices are essential. Although this paper will attempt to touch on most of the factors that need to be considered in any such study, the primary focus will be on the possible impact of loop environments on the reliability of optoelectronic devices and the methods required to help assure their reliability.

Paper Details

Date Published: 1 February 1991
PDF: 9 pages
Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); doi: 10.1117/12.24722
Show Author Affiliations
Roy S. Koelbl, Bell Communications Research (United States)


Published in SPIE Proceedings Vol. 1366:
Fiber Optics Reliability: Benign and Adverse Environments IV
Roger A. Greenwell; Dilip K. Paul, Editor(s)

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