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Proceedings Paper

Integrated optics displacement sensor
Author(s): Antonio d'Alessandro; Marco De Sario; Antonella D'Orazio; Vincenzo Petruzzelli
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Paper Abstract

Interferometric optical sensors have been shown to possess very high resolution due to the sensitivity of the optical path length to a variety of electrical, chemical and mechanical quantities. We present the design of an integrated optic microdisplacement sensor made of four single mode Ti:LiNbO3 channel waveguides on X-cut substrate shaped to form a semi-asymmetric X junction. The effects of the rotation of the waveguide axis with respect to the principal reference coordinate system and the influence of the fluctuations in the environment temperature have been accounted. The calculated effective index change is dnef/dT = 17.10-5oC-1 for EY-11 mode and dnef/dT = 5.3 .10-5 ° C-1 for Ex11 mode, respectively.

Paper Details

Date Published: 1 February 1991
PDF: 11 pages
Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); doi: 10.1117/12.24708
Show Author Affiliations
Antonio d'Alessandro, Univ. di Bari (Italy)
Marco De Sario, Univ. di Bari (Italy)
Antonella D'Orazio, Univ. di Bari (Italy)
Vincenzo Petruzzelli, Univ. di Bari (Italy)

Published in SPIE Proceedings Vol. 1366:
Fiber Optics Reliability: Benign and Adverse Environments IV
Roger A. Greenwell; Dilip K. Paul, Editor(s)

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