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Proceedings Paper

Power transmittance of optimized aspherical lens with large numerical aperture
Author(s): Zhanping Xu; Bernhard O. Bundschuh; Rudolf Schwarte; Otmar Loffeld; Ferdinand Klaus; Horst-Guenther Heinol; Ruediger Klein
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Paper Abstract

An optimized aspherical lens with large numerical aperture is demanded in many optical systems. In addressing the requirements, we have obtained analytical solutions of such a desired two-side aspherical lens by solving differential equations. Therefore geometrical parameters and index of refraction of the lens are explicitly expressed in the formulas. Lots of aspects of the aspherical lens can be seen by analyzing the obtained formulas rather than conventionally analyzing discrete data. Criteria of manufacturing the optimized lenses in different precision form uniquely depend on the refractive index of the plastics or glass material. On the basis of summarizing the work in this paper, we further derive formulas of power transmission for the optimized aspherical lens in several cases. The power transmission analysis is associated with typical radiation distribution of a source such as Lambertian or Gaussian distribution. Two polarized states of optical waves are also taken into account. Another criterion of manufacturing aspherical lenses with a specific transmittance is given according to the numerical aperture. It can be used to evaluate the power transmittance of plastic aspherical lenses without anti-reflection coating. A design according to the proper criteria allows more tolerances in the process of plastic lens manufacturing and assembling, while the analytically optimized results are more adaptive to compensation design for correcting deformation of materials.

Paper Details

Date Published: 19 August 1996
PDF: 8 pages
Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); doi: 10.1117/12.246801
Show Author Affiliations
Zhanping Xu, Univ. Siegen (Germany)
Bernhard O. Bundschuh, Fachhochschule Merseburg FB Elektrotechnik (Germany)
Rudolf Schwarte, Univ. Siegen (Germany)
Otmar Loffeld, Univ. Siegen (Germany)
Ferdinand Klaus, Univ. Siegen (Germany)
Horst-Guenther Heinol, Univ. Siegen (Germany)
Ruediger Klein, Univ. Siegen (Germany)

Published in SPIE Proceedings Vol. 2775:
Specification, Production, and Testing of Optical Components and Systems
Anthony E. Gee; Jean-Francois Houee, Editor(s)

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