Proceedings Paper
Optical polarization measurements of exciton-Zeeman splitting and carrier-spin relaxation in ZnxCd1-xSe/ZnSe multiquantum wells| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
We investigated exciton-Zeeman splitting and carrier-spin relaxation in ZnxCd1-xSe/ZnSe multi-quantum wells using magnetic circular dichroic (MCD) measurements and photoluminescence polarization (PLP) spectra. We obtained the exciton-g value from the exciton-Zeeman splitting in the MCD spectra. The well width and Cd composition measurements indicate the possibility of controlling the exciton-g value in a nonmagnetic II-VI compound system. We observed the polarization of the higher exciton levels in the PLP spectra as a result of carrier- spin relaxation. The light hole excitons with positive polarization were affected by the strain induced by the Cd composition in the well layer.
Paper Details
Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246182
Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246182
Show Author Affiliations
Takanari Yasui, RIKEN--The Institute of Physical and Chemical Research (Japan)
Baoping Zhang, RIKEN--The Institute of Physical and Chemical Research (Japan)
Baoping Zhang, RIKEN--The Institute of Physical and Chemical Research (Japan)
T. Yasuda, RIKEN--The Institute of Physical and Chemical Research (Japan)
Yusaburo Segawa, RIKEN--The Institute of Physical and Chemical Research (Japan)
Yusaburo Segawa, RIKEN--The Institute of Physical and Chemical Research (Japan)
Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)
© SPIE. Terms of Use
