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Proceedings Paper

Soft x-ray calibration of the Co/C multilayer mirrors for the Objective Crystal Spectrometer on the Spectrum Roentgen-Gamma satellite
Author(s): Salim Abdali; Charles Tarrio; Finn Erland Christensen; Herbert W. Schnopper
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Paper Abstract

The objective crystal spectrometer (OXS) on the forthcoming Spectrum-Roentgen-Gamma satellite is designed to carry three kinds of crystals: LiF(220), Si(111) and RAP(001), placed in front of the SODART telescope. Thirty six super polished (RMS roughness < 0.1nm) Si(111) substrates were coated with 65-80 periods of Co/C multilayers using electron beam evaporation deposition combined with ion polishing for the metal layers. These crystals are to be used in the energy band immediately below the C-K absorption edge of 0.284 keV. Because the crystals are to be assembled as one crystal on the OXS, the reflectivity performance as a function of energy and angle of incidence of all crystals has been measured using line radiation from an x-ray tube which provides 1.487 keV and 0.277 keV and using synchrotron radiation from 0.16 keV to 0.28 keV at the Synchrotron Ultraviolet Radiation electron storage ring a t the National Institute of Standards and Technology. The results from these measurements are discussed.

Paper Details

Date Published: 19 July 1996
PDF: 8 pages
Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); doi: 10.1117/12.245114
Show Author Affiliations
Salim Abdali, Danish Space Research Institute (Denmark)
Charles Tarrio, National Institute of Standards and Technology (United States)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)

Published in SPIE Proceedings Vol. 2805:
Multilayer and Grazing Incidence X-Ray/EUV Optics III
Richard B. Hoover; Arthur B. C. Walker II, Editor(s)

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