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Proceedings Paper

High-resolution grazing incidence x-ray spectrometer and its characteristics
Author(s): Xianxin Zhong; Shaotang He
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Paper Abstract

A novel soft x-ray grazing incidence spectrometer for studying laser produced plasma has been developed. The spectrometer is a complex system which is composed of three units: a grazing incidence grating spectrography, 4 dimensions micro adjustment equipment, and an aligning system with optical fiber bundle, electronic camera, TV monitor and laser transit. The spectrograph is used to resolve the lines of a soft x-ray spectra. The extreme ultraviolet spectra (time-integrated) region in the wavelength of 2-32nm. The resolving resolution of the spectrograph is 0.005nm.

Paper Details

Date Published: 19 July 1996
PDF: 2 pages
Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); doi: 10.1117/12.245087
Show Author Affiliations
Xianxin Zhong, Chongqing Univ. (China)
Shaotang He, China Academy of Engineering Physics (China)

Published in SPIE Proceedings Vol. 2805:
Multilayer and Grazing Incidence X-Ray/EUV Optics III
Richard B. Hoover; Arthur B. C. Walker II, Editor(s)

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