Proceedings Paper
Equivalent capacitance photodiode determination by an optical method| Format | Member Price | Non-Member Price |
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Paper Abstract
The paper deals with a dynamic method for measuring the photodiode equivalent capacitance and its dependence on voltage applied Based on an original and inexpen sive modelocking technique the method uses a computer evaluation of the measured response pulse shape for a certain value of the photodiode inverse bias voltages
Paper Details
Date Published: 1 February 1991
PDF: 6 pages
Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); doi: 10.1117/12.24456
Published in SPIE Proceedings Vol. 1362:
Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications
Manijeh Razeghi, Editor(s)
PDF: 6 pages
Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); doi: 10.1117/12.24456
Show Author Affiliations
Adrian Gh. Podoleanu, Polytechnical Institute of Bucharest (Romania)
Paul E. Sterian, Polytechnical Institute of Bucharest (Romania)
Paul E. Sterian, Polytechnical Institute of Bucharest (Romania)
Ion M. Popescu, Polytechnical Institute of Bucharest (Romania)
Niculae N. Puscas, Polytechnical Institute of Bucharest (Romania)
Niculae N. Puscas, Polytechnical Institute of Bucharest (Romania)
Published in SPIE Proceedings Vol. 1362:
Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications
Manijeh Razeghi, Editor(s)
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