
Proceedings Paper
X-ray diffraction analysis of some single crystals with special propertiesFormat | Member Price | Non-Member Price |
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Paper Abstract
New possibilities of the x-ray diffraction method for studies of some single crystals with special physical properties are analyzed. It is demonstrated that wide range temperature diffraction data, special single crystals experiments under strong electric fields, and charge density analysis in crystals might enrich our knowledge on the nature of the crystal properties.
Paper Details
Date Published: 12 July 1996
PDF: 4 pages
Proc. SPIE 2809, Space Processing of Materials, (12 July 1996); doi: 10.1117/12.244317
Published in SPIE Proceedings Vol. 2809:
Space Processing of Materials
Narayanan Ramachandran, Editor(s)
PDF: 4 pages
Proc. SPIE 2809, Space Processing of Materials, (12 July 1996); doi: 10.1117/12.244317
Show Author Affiliations
Mikhail Yu. Antipin, Institute of Organoelement Compounds (Russia)
Published in SPIE Proceedings Vol. 2809:
Space Processing of Materials
Narayanan Ramachandran, Editor(s)
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