Share Email Print
cover

Proceedings Paper

Luminescence molulation for the characterization of radiation damage within scintillator material
Author(s): Eberhard G. Bayer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The methode of luminescence modulation consists of a superposition of cw X-ray excitation and a short pulsed UV-light excitation. Making use of an excimer laser as UV source and a spectroscopic array detector with wavelength and time resolution it is possible to make sensitive short and long term characterisation of X-ray produced radiation damages within scintillator materials. Preliminary results of different doped and undoped materials will be presented and compared with results of conventional luminescence measurements.

Paper Details

Date Published: 1 March 1991
PDF: 5 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24396
Show Author Affiliations
Eberhard G. Bayer, Seimens AG (Germany)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization
Manijeh Razeghi, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray