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Proceedings Paper

Interferometry with respect to topological phases
Author(s): Alexander V. Tavrov; Vladimir A. Andreev; Dmitry V. Ublinsky
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Paper Abstract

Interferometry concept, that considers separately the phases: dynamical, Fresnel and topological has been elaborated. These phases have different origin. They are informative on specific properties of a sample, that is studied with an interferometer and a polarized light. Preliminary experiments have shown the confirmation of the role of topological phases in the interferogram formation. The concept has been applied to the micro-surface monitoring in real time.

Paper Details

Date Published: 17 June 1996
PDF: 9 pages
Proc. SPIE 2763, Electro-Optical Technology for Remote Chemical Detection and Identification, (17 June 1996);
Show Author Affiliations
Alexander V. Tavrov, Nanotech Co., Ltd (Russia)
Vladimir A. Andreev, P.N. Lebedev Physical Institute (Russia)
Dmitry V. Ublinsky, Nanotech Co., Ltd. (Russia)

Published in SPIE Proceedings Vol. 2763:
Electro-Optical Technology for Remote Chemical Detection and Identification
Mahmoud Fallahi; Ellen A. Howden, Editor(s)

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