Proceedings Paper
Fabrication and characteristics of long-wavelength infrared planar photodiodes on molecular beam epitaxial p-HgCdTe films| Format | Member Price | Non-Member Price |
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Paper Abstract
The results of MBE growth of CdHgTe epilayers and fabrication of photosensitive in 8 - 10 mkm region small p-n junctions using planar technology are presented. During MBE epitaxy the growing dynamic, composition and surface roughness were controlled in situ using build in high energy electron diffractometer and ellipsometer. Small area photosensitive diodes (50 X 70 mkm) were fabricated using planar technology and annealing under anodic oxide film. The measurements of V-I, spectral response and noise characteristics showed that the photodiodes on MCT epilayers grown by MBE have an acceptable parameters for fabrication of the linear and 2D photodiode arrays.
Paper Details
Date Published: 17 June 1996
PDF: 9 pages
Proc. SPIE 2746, Infrared Detectors and Focal Plane Arrays IV, (17 June 1996); doi: 10.1117/12.243041
Published in SPIE Proceedings Vol. 2746:
Infrared Detectors and Focal Plane Arrays IV
Eustace L. Dereniak; Robert E. Sampson, Editor(s)
PDF: 9 pages
Proc. SPIE 2746, Infrared Detectors and Focal Plane Arrays IV, (17 June 1996); doi: 10.1117/12.243041
Show Author Affiliations
Victor N. Ovsyuk, Institute of Semiconductor Physics (Russia)
S. A. Studenikin, Institute of Semiconductor Physics (Russia)
A. O. Suslyakov, Institute of Semiconductor Physics (Russia)
N. Kh. Talipov, Institute of Semiconductor Physics (Russia)
Vladimir V. Vasilyev, Institute of Semiconductor Physics (Russia)
S. A. Studenikin, Institute of Semiconductor Physics (Russia)
A. O. Suslyakov, Institute of Semiconductor Physics (Russia)
N. Kh. Talipov, Institute of Semiconductor Physics (Russia)
Vladimir V. Vasilyev, Institute of Semiconductor Physics (Russia)
T. I. Zahariash, Institute of Semiconductor Physics (Russia)
Yuri G. Sidorov, Institute of Semiconductor Physics (Russia)
Sergey A. Dvoretsky, Institute of Semiconductor Physics (Russia)
Nikolay N. Mikhailov, Institute of Semiconductor Physics (Russia)
Vasily S. Varavin, Institute of Semiconductor Physics (Russia)
Yuri G. Sidorov, Institute of Semiconductor Physics (Russia)
Sergey A. Dvoretsky, Institute of Semiconductor Physics (Russia)
Nikolay N. Mikhailov, Institute of Semiconductor Physics (Russia)
Vasily S. Varavin, Institute of Semiconductor Physics (Russia)
Published in SPIE Proceedings Vol. 2746:
Infrared Detectors and Focal Plane Arrays IV
Eustace L. Dereniak; Robert E. Sampson, Editor(s)
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