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Proceedings Paper

Optical properties measurements, instrumentation, and analytical tools for interactive signature analysis of targets and backgrounds
Author(s): William T. Kreiss; Richard Sam Dummer; James C. Jafolla
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Paper Abstract

A new era in signature simulation has arrived with the development of a family of instruments for the measurement of optical properties of materials. These new instruments, covering the spectral range from 0.2 to 200 microns plus millimeter waves, have been mated with workstations which control the measurement processes, and on which software for data analysis, signature simulation, and coatings design reside. Portability of the instruments allows measurements and analysis in the laboratory, or in the field. For the first time an analyst can affordably make rapid measurements of such quantities as bi-directional or directional reflectance/emittance of sample materials, analyze, plot, and archive the measurements, and then immediately use the new measurements in a signature simulation of targets, backgrounds and scenes. Alternatively, the analyst can design a unique coating and immediately subject the design to iterative analysis for target signature control or deception. This paper discusses the instruments and techniques for accomplishing the measurements and analysis.

Paper Details

Date Published: 17 June 1996
PDF: 10 pages
Proc. SPIE 2742, Targets and Backgrounds: Characterization and Representation II, (17 June 1996); doi: 10.1117/12.243020
Show Author Affiliations
William T. Kreiss, Georgia Tech Research Institute (United States)
Richard Sam Dummer, Surface Optics Corp. (United States)
James C. Jafolla, Surface Optics Corp. (United States)

Published in SPIE Proceedings Vol. 2742:
Targets and Backgrounds: Characterization and Representation II
Wendell R. Watkins; Dieter Clement, Editor(s)

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