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Proceedings Paper

Nonlinear effects in SEW excitation in Ag/fullerene thin film structures in Kretschmann configuration
Author(s): N. N. Il'ichev; Yuriy Y. Petrov; V. A. Yakovlev
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Paper Abstract

Dependence of minimum reflectivity angle on incidence light pulse energy at SEW excitation in Kretschmann's configuration was studied. CaF2 prism covered by thin layers of Ag and fullerene was used. Optical constants of fullerene thin layer were found: (epsilon) ' equals 3.86, (epsilon) ' equals 0.013 at wavelength 1.055 micrometers .

Paper Details

Date Published: 10 June 1996
PDF: 6 pages
Proc. SPIE 2801, Nonlinear Optics of Low-Dimensional Structures and New Materials, (10 June 1996); doi: 10.1117/12.242126
Show Author Affiliations
N. N. Il'ichev, General Physics Institute (Russia)
Yuriy Y. Petrov, Institute of Spectroscopy (Russia)
V. A. Yakovlev, Institute of Spectroscopy (Russia)

Published in SPIE Proceedings Vol. 2801:
Nonlinear Optics of Low-Dimensional Structures and New Materials
Vladimir I. Emel'yanov; Vladislav Ya. Panchenko, Editor(s)

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