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Proceedings Paper

Numerical ellipsometry applied to photoelasticity
Author(s): Andre Robert; Jean Royer; Alexandre Fedorov
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Paper Abstract

This original photoelasticity contribution is based on the combination of a modulation of the polarization vector of the light form to be measured with a signal processing of the light energy received by the phototransducer. By means of the described device one gets the equivalent of a special ellipsometer providing the coordinates of the polarization vector in Stokes space. The classical photoelastic parameters of either the analyzed light or the studied model can be derived directly by the microcomputer. The prototype on use is presented hereafter with the main setting to be carried on the first use. The very simplicity of mechanical set up associated with only two optical operators provides an accurate measurement of the ellipsis parameters of the light vector. The numerical treatment applied on the sampled signal relevant to the light energy avoids all the uncertainties that were previously involved by the analogical treatment of the electrical signal. Moreover control of any light operator is no more used. This automatic principle can be used in all the fields of photoelastic measurements such as plane or three dimensional applications.

Paper Details

Date Published: 10 June 1996
PDF: 6 pages
Proc. SPIE 2791, Photomechanics '95, (10 June 1996); doi: 10.1117/12.242110
Show Author Affiliations
Andre Robert, Ecole Centrale de Nantes (France)
Jean Royer, Ecole Centrale de Nantes (France)
Alexandre Fedorov, Ecole Centrale de Nantes (France)

Published in SPIE Proceedings Vol. 2791:
Photomechanics '95
M. Kh. Akhmetzyanov; S. I. Gerasimov; K. L. Komarov, Editor(s)

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