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Proceedings Paper

Fast slit-scan method for MTF and MRTD characterization in the HITL environment
Author(s): James Lynn Smith
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Paper Abstract

A method based on the line scan of a narrow slit pattern is described for MTF and MRTD determinations. A digital signal analyzer and automatic computer worksheet are utilized for executing this methodology. This single-scan procedure can replace a series of measurements with different sized bar patterns, and it facilitates rapid imaging system characterization for weapons scheduled for intensive hardware-in-the-loop testing. The challenge of this method was to overcome the practical data processing problems encountered. MRTD determinations using the slit-scan method agree very well with conventional bar pattern measurements and has been validated for a variety of imaging sensors. The automatic worksheet analysis determines MTF and both the objective, line scan MRTD as well as the 'eye-brain MRTD' based on a human vision model.

Paper Details

Date Published: 10 June 1996
PDF: 10 pages
Proc. SPIE 2743, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VII, (10 June 1996); doi: 10.1117/12.241962
Show Author Affiliations
James Lynn Smith, Vitro Technical Services (United States)

Published in SPIE Proceedings Vol. 2743:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VII
Gerald C. Holst, Editor(s)

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