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Proceedings Paper

512x512 WISP (wideband infrared scene projector) arrays
Author(s): Barry E. Cole; Robert E. Higashi; Jeff A. Ridley; J. Holmen; James W. Arendt; Charles L. Malone; Robert G. Stockbridge; George C. Goldsmith II; Lawrence E. Jones
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Paper Abstract

An addressable mosaic array of resistively heated microbridges offers much flexibility for infrared scene simulations. In the Wide Band Infrared Scene Projector program, Honeywell has demonstrated high yield arrays up to size 512 X 512 capable of room temperature operation for a 2 band infrared projection system being designed and built by Contraves Inc. for the Wright Laboratory Kinetic Kill Vehicle Hardware In-the-Loop Simulator facility at Eglin Air Force Base, FL. The arrays contain two different pixel designs, one pixel designed for kHz frame rates and high radiance achieved at a power level of 2.5 mWatts/pixel and the other pixel designed for more moderate 100 Hz frame rates at lower radiance and at maximum power levels of 0.7 mWatts/pixels. Tests on arrays and pixels have demonstrated dynamic ranges up to 850:1, radiance rise times on the order of 2 mseconds, and broadband pixel emissivities in the range of 70%. Arrays have been fabricated with less than 0.1% pixel outages and no row or column defects. These arrays are mounted in a specialized vacuum assembly containing an IR window, vacuum package, cooling block, and pump out manifold.

Paper Details

Date Published: 24 May 1996
PDF: 13 pages
Proc. SPIE 2741, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing, (24 May 1996); doi: 10.1117/12.241131
Show Author Affiliations
Barry E. Cole, Honeywell Inc. (United States)
Robert E. Higashi, Honeywell Inc. (United States)
Jeff A. Ridley, Honeywell Inc. (United States)
J. Holmen, Honeywell Inc. (United States)
James W. Arendt, Contraves (United States)
Charles L. Malone, Contraves (United States)
Robert G. Stockbridge, Air Force Wright Lab. (United States)
George C. Goldsmith II, 46th Test Wing/Guided Weapons Evaluation Facility (United States)
Lawrence E. Jones, Science Applications International Corp. (United States)

Published in SPIE Proceedings Vol. 2741:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing
Robert Lee Murrer Jr., Editor(s)

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