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Proceedings Paper

Microcharacterization of semiconductor laser diodes: materials and devices
Author(s): Abram Jakubowicz
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Paper Abstract

This paper illustrates the application of microscopy techniques to investigate various material processing and device-related problems that one encounters in the development of semiconductor laser diodes. General comments are made concerning local characterization of semiconductors. Various laser reliability/degradation issues are addressed. As an example of how microscopy techniques facilitate the building of modern lasers, the application of the ordering phenomenon is discussed.

Paper Details

Date Published: 8 April 1996
PDF: 11 pages
Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); doi: 10.1117/12.238185
Show Author Affiliations
Abram Jakubowicz, IBM Research Div./Zurich Research Lab. (Switzerland)

Published in SPIE Proceedings Vol. 2780:
Metal/Nonmetal Microsystems: Physics, Technology, and Applications
Benedykt W. Licznerski; Andrzej Dziedzic, Editor(s)

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