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Proceedings Paper

Temperature dependence of resistance in percolation systems
Author(s): Andrei A. Snarskii; Andrzej Dziedzic; Benedykt W. Licznerski
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Paper Abstract

An analytical description of temperature dependence of resistance in a classical percolation system is presented for the first time. Three concentration ranges of conductive phase -- below and above percolation threshold as well as inside smearing region -- have been analyzed. Useability of presented results has been discussed for such random inhomogeneous media as cermet and polymer thick film resistors as well as cermet thin film ones.

Paper Details

Date Published: 8 April 1996
PDF: 5 pages
Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); doi: 10.1117/12.238130
Show Author Affiliations
Andrei A. Snarskii, Kiev Polytechnical Institute (Ukraine)
Andrzej Dziedzic, Technical Univ. of Wroclaw (Poland)
Benedykt W. Licznerski, Technical Univ. of Wroclaw (Poland)

Published in SPIE Proceedings Vol. 2780:
Metal/Nonmetal Microsystems: Physics, Technology, and Applications
Benedykt W. Licznerski; Andrzej Dziedzic, Editor(s)

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