
Proceedings Paper
Investigations on porous silicon layers with regard to chemical microsensor applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
A new concept for silicon microsensors based on porous EIS (Electrolyte-Insulator- Semiconductor) structures is presented. The porous sensor was prepared by anodic etching of n-doped silicon and subsequent deposition of a dielectric layer of SiO2. Experimental conditions were investigated to realize a well-defined macroporous formation of the porous silicon. To compare the chemical sensor properties with similar built-up planar Si/SiO2 structures, C/V (Capacitance-Voltage) measurements have been performed. The porous EIS structures have been characterized by SEM (Scanning Electron Microscopy), XPS (X-ray Photoelectron Spectroscopy) and cyclic voltammetry. This solid-state technology allows the preparation of transducer materials for pH microsensors.
Paper Details
Date Published: 26 April 1996
PDF: 6 pages
Proc. SPIE 2779, 3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials, (26 April 1996); doi: 10.1117/12.237125
Published in SPIE Proceedings Vol. 2779:
3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials
Pierre Francois Gobin; Jacques Tatibouet, Editor(s)
PDF: 6 pages
Proc. SPIE 2779, 3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials, (26 April 1996); doi: 10.1117/12.237125
Show Author Affiliations
Michael J. Schoening, Forschungszentrum Juelich GmbH (Germany)
M. Crott, Forschungszentrum Juelich GmbH (Germany)
F. Ronkel, Heinrich-Heine-Univ. Duesseldorf (Germany)
M. Thust, Forschungszentrum Juelich GmbH (Germany)
M. Crott, Forschungszentrum Juelich GmbH (Germany)
F. Ronkel, Heinrich-Heine-Univ. Duesseldorf (Germany)
M. Thust, Forschungszentrum Juelich GmbH (Germany)
J. Walter Schultze, Heinrich-Heine-Univ. Duesseldorf (Germany)
Peter Kordos, Forschungszentrum Juelich GmbH (Germany)
Hans Luth, Forschungszentrum Juelich GmbH (Germany)
Peter Kordos, Forschungszentrum Juelich GmbH (Germany)
Hans Luth, Forschungszentrum Juelich GmbH (Germany)
Published in SPIE Proceedings Vol. 2779:
3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials
Pierre Francois Gobin; Jacques Tatibouet, Editor(s)
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