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Proceedings Paper

Optical test of a photonic FIFO page buffer memory
Author(s): Joseph Earl Ford; Ashok V. Krishnamoorthy; Keith W. Goossen; Jim A. Walker; David A. B. Miller; Rick L. Morrison; Anthony L. Lentine; Sanghee P. Hui; Betty Tseng; Leo M. F. Chirovsky; Ronald E. Leibenguth; D. Kossives; D. Dahringer; L. Arthur D'Asaro; G. F. Aplin; Richard G. Rozier; Fouad E. Kiamilev
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Paper Abstract

We describe the parallel optical test of a photonic first-in-first-out (PFIFO) buffer memory based on flip-chip CMOS/SEED optoelectronic technology. The PFIFO detects pages of 4 by 8 binary bits, stores them in a 32 bit deep buffer memory, and transmits them in a 16 by 2 output modulator array. All 32 I/O and memory channels functioned, with an average input power of 40 microwatts and a minimum output contrast ratio of 2:1.

Paper Details

Date Published: 20 March 1996
PDF: 9 pages
Proc. SPIE 2692, Optical Interconnects in Broadband Switching Architectures, (20 March 1996); doi: 10.1117/12.235854
Show Author Affiliations
Joseph Earl Ford, AT&T Bell Labs. (United States)
Ashok V. Krishnamoorthy, AT&T Bell Labs. (United States)
Keith W. Goossen, AT&T Bell Labs. (United States)
Jim A. Walker, AT&T Bell Labs. (United States)
David A. B. Miller, AT&T Bell Labs. (United States)
Rick L. Morrison, AT&T Bell Labs. (United States)
Anthony L. Lentine, AT&T Bell Labs. (United States)
Sanghee P. Hui, AT&T Bell Labs. (United States)
Betty Tseng, AT&T Bell Labs. (United States)
Leo M. F. Chirovsky, AT&T Bell Labs. (United States)
Ronald E. Leibenguth, AT&T Bell Labs. (United States)
D. Kossives, AT&T Bell Labs. (United States)
D. Dahringer, AT&T Bell Labs. (United States)
L. Arthur D'Asaro, AT&T Bell Labs. (United States)
G. F. Aplin, Univ. of North Carolina/Charlotte (United States)
Richard G. Rozier, Univ. of North Carolina/Charlotte (United States)
Fouad E. Kiamilev, Univ. of North Carolina/Charlotte (United States)

Published in SPIE Proceedings Vol. 2692:
Optical Interconnects in Broadband Switching Architectures
Thomas J. Cloonan, Editor(s)

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