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Proceedings Paper

Time-resolved x-ray scattering studies using CCD detectors
Author(s): Roy Clarke; Waldemar Dos Passos; Walter P. Lowe; Brian G. Rodricks; Christine M. Brizard
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Paper Abstract

The advent of extremely bright x-ray beams from new low-emittance sources such as ESRF and APS offers new opportunities for materials research. One of the most exciting and technologically demanding areas is likely to be time-resolved x-ray studies. Our recent experiments at NSLS Brookhaven (Beamline X-16B) explore some of the challenges for time-resolved x-ray scattering combining developments in x-ray optics (dispersive geometry) area detectors (CCD''s) and fast data acquisition. The techniques are illustrated with results on the rapid thermal annealing of electronic materials including strained-layer InGai_As quantum-well structures. We describe the application of a new virtual-phase CCD detector for real-time diffraction studies at the microsecond time scale. 1.

Paper Details

Date Published: 1 January 1991
PDF: 14 pages
Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); doi: 10.1117/12.23306
Show Author Affiliations
Roy Clarke, Univ. of Michigan (United States)
Waldemar Dos Passos, Univ. of Michigan (United States)
Walter P. Lowe, AT&T Bell Labs. (United States)
Brian G. Rodricks, Argonne National Lab. (United States)
Christine M. Brizard, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 1345:
Advanced X-Ray/EUV Radiation Sources and Applications
James P. Knauer; Gopal K. Shenoy, Editor(s)

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