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Proceedings Paper

An adaptive optics 3D STED microscope for super-resolution imaging of thick samples with background noise suppression using digital image processing
Author(s): Piotr Zdańkowski; Maciej Trusiak; Maria Cywińska; Jason R. Swedlow
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Paper Abstract

The emerge of super-resolution (SR) microscopy enabled imaging below the diffraction barrier. One of the SR techniques, Stimulated Emission Depletion (STED) microscopy, has shown promise in super-resolution imaging of thick specimen. Imaging such structures is a non-trivial task due to the increased aberrations introduced by the sample. Adaptive optics provides the solution to this problem. AO can correct the aberrations by modulation of the phase. Although STED microscopy is theoretically a diffraction unlimited technique, the resolution limiting factor is noise. Modern filtering techniques, such as block matching and 3D filtering (BM3D), can increase the signal-to-noise ratio of the STED images. This work presents an AO 3D STED microscope with aberration correction and background noise filtering using BM3D algorithm. We show the super-resolution images of thick samples and emphasize the importance of image processing for recovering of object high spatial frequencies.

Paper Details

Date Published: 7 September 2018
PDF: 9 pages
Proc. SPIE 10834, Speckle 2018: VII International Conference on Speckle Metrology, 108342G (7 September 2018); doi: 10.1117/12.2324145
Show Author Affiliations
Piotr Zdańkowski, Univ. of Dundee (United Kingdom)
Warsaw Univ. of Technology (Poland)
Maciej Trusiak, Warsaw Univ. of Technology (Poland)
Maria Cywińska, Warsaw Univ. of Technology (Poland)
Jason R. Swedlow, Univ. of Dundee (United Kingdom)

Published in SPIE Proceedings Vol. 10834:
Speckle 2018: VII International Conference on Speckle Metrology
Malgorzata Kujawińska; Leszek R. Jaroszewicz, Editor(s)

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