Share Email Print

Proceedings Paper

Amplitude checker grating-based multichannel lateral shear interferometry for extended aberration sensing
Author(s): Łukasz Służewski; Krzysztof Patorski; Maciej Trusiak
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A novel, single shot, low cost, multidirectional lateral shear interferometer for extended range wave front sensing has been developed. It exploits the Fresnel diffraction field formed by five lowest diffraction orders of a simple amplitude checker grating. The Fresnel pattern encodes information on four directional partial derivatives of the wavefront under test. It has been theoretically and experimentally shown that for larger gradient phase objects or shear amounts only diagonal derivative information is easily accessible. The x and y direction gradient maps are strongly amplitude modulated. Therefore their demodulation becomes a formidable task. The same feature has been found in widely used quadriwave interferometer developed at ONERA, France. The results of analytical studies and experimental works including fringe pattern processing and phase demodulation are presented.

Paper Details

Date Published: 18 August 2018
PDF: 10 pages
Proc. SPIE 10749, Interferometry XIX, 107490N (18 August 2018); doi: 10.1117/12.2323648
Show Author Affiliations
Łukasz Służewski, Warsaw Univ. of Technology (Poland)
Krzysztof Patorski, Warsaw Univ. of Technology (Poland)
Maciej Trusiak, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 10749:
Interferometry XIX
Katherine Creath; Jan Burke; Michael B. North Morris; Angela D. Davies, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?