
Proceedings Paper
Research for infrared ship target characteristics based on space-based detectionFormat | Member Price | Non-Member Price |
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Paper Abstract
Ship target detection is increasingly important to the current war today. Space-based Detection is an important way for getting the remote-sensing image included the ship target. Ship target characteristics analysis is the key of infrared image reorganization. It includes the thermal radiation of the target and background, Atmospheric transmission characteristics, imaging characteristics of detector and target characteristics. In order to get the simulation image in the infrared long-waveband, it analyses the characteristics of the infrared ship target and background. The target characteristics are known clearly, it could make the extraction process of target more effective and accurate. The target characteristics analysis is more conducive to the detection and recognition of the target.
Paper Details
Date Published: 5 November 2018
PDF
Proc. SPIE 10816, Advanced Optical Imaging Technologies, 108160U (5 November 2018); doi: 10.1117/12.2323381
Published in SPIE Proceedings Vol. 10816:
Advanced Optical Imaging Technologies
Xiao-Cong Yuan; Kebin Shi; Michael G. Somekh, Editor(s)
Proc. SPIE 10816, Advanced Optical Imaging Technologies, 108160U (5 November 2018); doi: 10.1117/12.2323381
Show Author Affiliations
Yu Zhang, Shanghai Aerospace Electronic Technology Institute (China)
Jiyang Shang, Shanghai Aerospace Electronic Technology Institute (China)
Baorong Xie, Shanghai Aerospace Electronic Technology Institute (China)
Jiyang Shang, Shanghai Aerospace Electronic Technology Institute (China)
Baorong Xie, Shanghai Aerospace Electronic Technology Institute (China)
Rongli Ding, Shanghai Aerospace Electronic Technology Institute (China)
Zhen Zhang, Shanghai Aerospace Electronic Technology Institute (China)
Zhen Zhang, Shanghai Aerospace Electronic Technology Institute (China)
Published in SPIE Proceedings Vol. 10816:
Advanced Optical Imaging Technologies
Xiao-Cong Yuan; Kebin Shi; Michael G. Somekh, Editor(s)
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