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Proceedings Paper

Optical nano-imaging via photonless detection in scanning probe microscopy (Conference Presentation)
Author(s): Antonio Ambrosio

Paper Abstract

In Photo-induced Force Microscopy (PiFM) the near-field signal resulting from the surface illumination is detected via the interaction with the AFM cantilever. Unlike conventional Near-field Scanning Optical Microscopes (NSOM), both fiber-based and scattering-based, where much research is dedicated to suppress the background signal, in PiFM, no light signal is detected. In this sense PiFM is a light-background-free optical nano-spectroscopy technique that is promising for broadband operation and relaxes many of the illumination constraints of other NSOM techniques. I will first introduce tests experiments that highlight the working principles behind PiFM. Then, I will show results from ongoing experiments of PiFM on different materials, ranging from photo-sensitive polymers to 2D van der Waals materials.

Paper Details

Date Published: 18 September 2018
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Proc. SPIE 10734, Quantum Nanophotonics 2018, 107340H (18 September 2018); doi: 10.1117/12.2322546
Show Author Affiliations
Antonio Ambrosio, Harvard Univ. (United States)


Published in SPIE Proceedings Vol. 10734:
Quantum Nanophotonics 2018
Jennifer A. Dionne; Mark Lawrence; Matthew T. Sheldon, Editor(s)

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