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Proceedings Paper

High-resolution stigmatic EUV spectroheliometer for studies of the fine scale structure of the solar chromosphere, transition region, and corona
Author(s): J. Gethyn Timothy; Thomas E. Berger; Jeffrey S. Morgan; Arthur B. C. Walker II; Jagadish C. Bhattacharyya; Surendra K. Jain; Ajay Kumar Saxena; Martin H.C. Huber; Giuseppe Tondello; Giampiero Naletto
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Paper Abstract

We describe the design of a high-resolution stigmatic extreme-ultraviolet (EUV) spectroheliometer, configured for flight on a Black Brant sounding rocket, which consists of a 45-cm Gregory telescope coupled to a spectrometer employing a single toroidal diffraction grating in a normal-incidence Rowland circle mounting and an imaging pulse-counting Multi-Anode Microchannel Array (MAMA) detector system. The toroidal diffraction grating is fabricated by a new technique employing an elastically-deformable sub-master grating which is replicated in a spherical form and then mechanically distorted to produce the desired aspect ratio of the toroidal surface for stigmatic imaging over the selected wavelength range. The spectroheliometer will produce spatially-resolved spectra of the chromosphere, transition-region and corona with an angular resolution of 0.4 arc sec or better, a spectral resolution AII of about 1O in first order, and a temporal resolution of the order of seconds. Because of the geometric fidelity of the MAMA detector system, the speciroheliometer will be able to determine Doppler shifts to a resolution of at least 2 mA at wavelengths near 600 A (-1.0 km s1), depending on the level of the accumulated signal. The unique characteristics of the spectroheliometer will be used in combination with plasma-diagnostic techniques to study the temperature, density and velocity structures of specific features in the solar outer atmosphere.

Paper Details

Date Published: 1 February 1991
PDF: 9 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23223
Show Author Affiliations
J. Gethyn Timothy, Stanford Univ. (United States)
Thomas E. Berger, Stanford Univ. (United States)
Jeffrey S. Morgan, Stanford Univ. (United States)
Arthur B. C. Walker II, Stanford Univ. (United States)
Jagadish C. Bhattacharyya, Indian Institute of Astrophysics (India)
Surendra K. Jain, Indian Institute of Astrophysics (India)
Ajay Kumar Saxena, Indian Institute of Astrophysics (India)
Martin H.C. Huber, European Space Agency/ESTEC (Netherlands)
Giuseppe Tondello, Univ. di Padova (Italy)
Giampiero Naletto, Univ. di Padova (Italy)

Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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