High-repetition-rate self-seeded x-ray free-electron lasers (XFELs), such as the European XFEL in Hamburg (Germany) and upcoming LCLS-II-HE in Stanford (USA) are promising up to three orders of magnitude increase in average spectral flux than what is currently possible with storage-ring-based synchrotron radiation sources [1-4]. This will open up exciting new opportunities for hard x-ray spectroscopic techniques. The new hard x-ray sources with the highest spectral brilliance are offering not only opportunities. There are also challenges, in particular, how to deal with the XFEL beams of very high average and peak power. To address these challenges we have designed, manufactured, and tested diamond channel-cut crystals, to function as high-heat-load, beam-multiplexing, and high-resolution (15-meV bandwidth) monochromators. Diamond channel-cut crystals in the (008) and the (620) orientations were manufactured at the Technological Institute for Superhard and Novel Carbon Materials by application of the newest laser machining technologies [5]. X-ray double-crystal sequential topography and reflectivity studies performed at the Advanced Photon Source demonstrate a close to theoretical performance of the diamond channel cut crystals. We will present details on manufacturing and characterization of the channel-cut crystals. Acknowledgments Work at Argonne National Laboratory was supported by the U.S. Department of Energy, Office of Science, under Contract No. DE-AC02-06CH11357. Work at the Technological Institute for Superhard and Novel Carbon Materials was supported by the Ministry of Education and Science of the Russian Federation, References [1] E. L. Saldin, E. A. Schneidmiller, Yu. Shvyd'ko and M. V. Yurkov, NIM A, 475 (2001) 357 [2] X. Yang and Yu. Shvyd'ko, Phys. Rev. ST Accel. Beams, 16 (2013) 120701 [3] O. Chubar, G. Geloni, V. Kocharyan, A. Madsen, E. Saldin, S. Serkez, Yu. Shvyd’ko, and J. Sutter, J. Synchrotron Radiation, 23 (2016) 410–424 [4] G. Geloni, V. Kocharyan, E. Saldin arXiv:1508.04339 (2015) [5] T. Kolodziej, P. Vodnala, S. Terentyev, V. Blank and Yu. Shvyd'ko, J. Appl. Cryst., 49 (2016) 1240

Date Published: 18 September 2018
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Proc. SPIE 10760, Advances in X-Ray/EUV Optics and Components XIII, 107600H (18 September 2018); doi: 10.1117/12.2322189

Published in SPIE Proceedings Vol. 10760:
Advances in X-Ray/EUV Optics and Components XIII
Shunji Goto; Christian Morawe; Ali M. Khounsary, Editor(s)